
TECHNICAL SPECIFICATIONS
STANDARD STOCK
100mm Prime Wafers
Physical & Crystallographic Properties
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Diameter: 100 ± 0.3 mm
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Material; Silicon (Si)
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Growth Method: (CZ)
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Grade: Prime (Device Quality)
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Type / Dopant: P-Type / Boron (P/B)
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Crystal Orientation: <100> ± 0.5°
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Resistivity: 1.0 – 5.0 Ω·cm
Mechanical Specifications
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Thickness: 525 ± 20 µm
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Total Thickness Variation (TTV): < 5 µm
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Bow: < 30 µm
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Warp: < 30 µm
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Orientation Features: 2 SEMI-Standard Flats
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Primary Flat Location: @ {110} ± 1°
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Primary Flat Length: 32.5 ± 2.5 mm
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Secondary Flat Location: 90° CW from Primary Flat
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Secondary Flat Length: 18.0 ± 2.0 mm
Surface & Purity Control
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Surface Finish (Front): Mirror Polished (SSP)
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Surface Finish (Back): Etched / Standard Finish
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Particle Count: < 10 ea/wf (@ ≥ 0.3 µm)
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Laser Mark: None
100mm Test Wafers
Physical & Crystallographic Properties
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Diameter: 100 ± 0.3 mm
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Material: Silicon (Si)
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Growth Method: Czochralski (CZ)
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Grade: Test / Monitor Grade
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Type / Dopant: P-Type / Boron (P/B)
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Crystal Orientation: <100> ± 0.5°
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Resistivity: > 1 Ω·cm
Mechanical Specifications
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Thickness: 525 ± 25 µm
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Total Thickness Variation (TTV): < 10 µm
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Bow: < 30 µm
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Warp: < 30 µm
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Orientation Features: 2 SEMI-Standard Flats
Surface & Purity Control
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Surface Finish (Front): Mirror Polished (SSP)
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Surface Finish (Back): Etched / Standard Finish
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Particle Count: < 10 ea/wf (@ ≥ 0.5 µm)
Documentation Downloads
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Link: [Download Sample]
Packaging & Handling Details
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FOSB/Cassette Info: Wafers are shipped in standard 25-slot Front Opening Shipping Boxes (FOSB)
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Cleanroom Standards: Double-bagged in ESD-safe, cleanroom-compatible packaging for immediate fab entry.

CUSTOM SOURCING
We source 100mm, 150mm, and 200mm prime and test grade wafers. Waferwave leverages a global network to source custom silicon with transparent lead times. [Request a quote for custom sourcing].